FEI Tecnai G2 F20 ST FE-TEM - Materials

 FEI Tecnai F20 ST - Materials

 

The installation of the FEI Tecnai G2 F20 ST was completed in 2010, and is now ready for use, primarily for materials applications. This 200 kV instrument features:

 

-         ZrO2/W (100) Schottky Field emitter (FEG);

-         S-Twin objective lens;

-         Point resolution: 0.24 nm;

-         Information limit: 0.15 nm;

-         Magnification range: 21.5 x - 1050 kx in TEM mode;

-         Magnification range: 10 kx – 330 Mx in STEM mode;

-         Camera Length range: 30 – 4600 mm in TEM mode;

-         Fully computer-controlled, eucentric side-entry, high stability CompuStage;

-         Fully computer-controlled and automated apertures;

-         Gatan CCD: 2k x 2k CCD camera;

-         Fischione ultra-high resolution STEM HAADF detector;

-         EDAX instruments EDS detector (point, line, and area profiling);

-         Single and double tilt specimen holders (α = +/- 40º);

-         Xplore3D for automated tomographic tilt series acquisition in TEM or STEM mode;

-         Inspect 3D on a support PC for tomographic reconstructions.

 

For further information on this instrument, contact Dr. Hansoo Kim (Tel. 979-862-8452; luminesc@tamu.edu).