The installation of the FEI Tecnai G2 F20 was completed this January and is now ready for use. This 200 kV instrument features:

-         ZrO2/W (100) Schottky Field emitter (FEG)

-         Point resolution: 0.27 nm

-         Information limit: 0.16 nm

-         Magnification range: 21x - 700 kx in TEM mode, and 410x - 1350 kx in EFTEM mode

-         Camera Length range: 52 – 1500 mm in TEM mode, and 110 – 7000 mm in EFTEM mode

-         Fully computer-controlled, eucentric side-entry, high stability CompuStage

-         Gatan  Tridiem GIF-CCD: 2kx2k CCD camera and post column energy filter (GIF)

-         Fischione ultra-high resolution STEM HAADF detector

-         Oxford instruments EDS detector

-         Single and double tilt specimen holders (α= +/- 60º)

-         Gatan 626 cryo specimen holder, cryo transfer station and cold stage controller

-         FEI Vitrobot for cryo-TEM preparation

-         Xplore3D for automated tomographic tilt series acquisition

-         Inspect 3D on a support PC for tomographic reconstructions

This new instrument offers the improved imaging capabilities over the JEOL 1200EX and JEOL2010 but in addition offers:

-         EELS (Electron Energy Loss Spectroscopy) for elemental mapping and high contrast zero energy loss imaging of

          thicker samples

-         Improved EDS analytical capabilities (point, line scan and mapping) through specimen drift correction control

-         Z-contrast dark-field STEM imaging using the HAADF detector

-         Cryo- and low-dose-EM for biological macromolecules or other beam-sensitive specimens, as well as cooling

           experiment for material samples down to liquid nitrogen temperature

-         Automated collection of tilt series for room temperature or cryo-electron tomography

For further information on this instrument, contact Dr. Zhiping Luo or Dr. Hansoo Kim (for materials applications) or Dr. Christos Savva (for life sciences applications).