Winner: Yang Hyun Auh
“MXene nanosheet and composite membrane”
These images show Ti₃C₂Tₓ MXene nanosheets and composite membranes complexed with polymer. The images were taken using SEM (JEOL JSM-7500F and Tescan FERA-3 Model GMH Focused Ion Beam Microscope, respectively) and TEM (Titan Themis 300 S/TEM). The images submitted by Yang Hyun Auh from Dr. Jodie L. Lutkenhaus’s lab are courtesy of Natalie N. Neal, Dr. Kailash Arole, Dr. Yordanos Bisrat and Dr. Sisi Xiang.
Cross-sectional TEM measurement was performed by preparing film sections cut from each LbL-coated substrate using focused ion beam (FIB) milling with a Tescan FERA-3 Model GMH FIB-SEM system. A Ga⁺ ion beam was used to mill the samples after depositing protective Pt layer over the region of interest.
SEM Acquisition Info
Instruments: JEOL JSM-7500F, Tescan FERA-3 FIB-SEM
Sample prep: 5 nm sputter coating on Si substrates
FIB milling conditions: 30 kV Ga⁺ beam, 12 nA–50 pA
Purpose: top-view imaging and lamella fabrication
Instrument: Titan Themis 300 (300 kV, aberration-corrected)
Mode: S/TEM with Super-X EDS
Camera length: 91 mm (STEM)
Sample: FIB-milled lamella with Pt protective layer
Purpose: cross-sectional imaging