Presentation: November 3, 2026

Tuesday November 3rd

10:00 -11:30am

ILSB Rm. 1143 and live streamed via Zoom. 

Hands-on sessions: November 3 & 4, 2026 

Tuesday, November 3rd, 1:00 – 2:30pm

Tuesday, November 3rd, 2:30 – 4:00pm

Wednesday,  November 4th, 1:00 – 2:30pm

Wednesday, November 4th, 2:30 – 4:00pm

ILSB 1143

Summary

This workshop is free of charge for Texas A&M University participants. It is intended is for students and researchers new to Scanning Electron Microscopy. The presentations will cover basic principles of SEM imaging, factors affecting resolution and contrast, and basic sample preparation techniques. The presentation will be accessible both in person and online via Zoom.

Tescan Vega SEM

Details

In the afternoon in-person hands-on sessions, we will mount and sputter coat or osmium vapor coat samples and image them in the Tescan Vega SEM. Workshop participants will have an opportunity to operate the microscope, align and stigmate the electron beam, and image samples with Secondary Electron and Backscattered electron detectors, at different accelerating voltages. Elemental analysis using the X-Ray Energy Dispersion Spectroscopy (EDS) will be also demonstrated.

Registration

Free!

Each hands-on session is limited to 5 persons and is first-come, first-serve. The first five people who register will get that slot; any extra registrants will be offered alternative times.