Promoting cutting edge research in basic and applied sciences through research and development activities
FREE Scanning Electron Microscopy Workshop
Read moreNovember 3 - 4, 2026
10:00 am - 4:00 pm, 1:00 pm - 4:00 pmILSB 1143 & Virtual
This workshop is free of charge for Texas A&M University participants. It is intended is for students and researchers new to Scanning Electron Microscopy. The presentations will cover basic principles of SEM imaging, factors affecting resolution and contrast, and basic sample preparation techniques. The presentation will be accessible both in person and online via Zoom. Each hands-on session is limited to 5 registrants.
News Feed
Data acquired at the MIC is being used to further research all over campus and beyond. Read more of the articles citing use of the MIC here.
