Promoting cutting edge research in basic and applied sciences through research and development activities
Scanning Electron Microscopy Short Course 2026
Read moreAugust 18 - 19, 2026
9:00 am - 5:00 pmILSB 1143 (Lectures); MIC facility in ILSB (afternoon lab sessions)
Learn the principles of sample preparation, SEM and high resolution SEM imaging, EDS/EBSD analysis, Focused Ion Beam (FIB) milling, and computational image analysis. Intended for those new to SEM and those with experience who would like a better understanding.
News Feed
Data acquired at the MIC is being used to further research all over campus and beyond. Read more of the articles citing use of the MIC here.
