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Scanning Electron Microscopy

Mounting of samples on SEM stubs:


TFS Helios 5 CX DualBeam CRYO FIB-SEM

FEI Quanta 600 FE-SEM

The Quanta 600 FEG is a field emission scanning electron microscope capable of generating and collecting high-resolution and low-vacuum images.

Tescan Vega SEM

Investigation of non-conductive samples is possible in the variable pressure mode and the Oxford EDS detector allows for the characterization of elements in a sample.