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Instruments

Transmission Electron Microscopy

FEI Tecnai G2 F20 ST FE-TEM – Materials

Morphological, crystallographic, and elemental analysis of bulk and nanoscale materials.

FEI Tecnai G2 F20 FE-TEM

  • Z-contrast dark-field STEM imaging using HAADF detector
  • Oxford instruments EDS detector
  • EELS (Electron Energy Loss Spectroscopy) for elemental mapping and high contrast zero energy loss imaging of thicker samples
  • Automated collection of tilt series for room temperature or cryo-electron tomography in TEM or STEM mode

JEOL 1200 EX TEM

Provides excellent contrast for biological as well as materials samples with double condenser projection lens and bright/dark field imaging.

JEOL JEM-2010 TEM

This high-resolution analytical TEM is used mainly for materials research and is capable of elemental mapping using the INCA Semi-STEM mode.