Skip Navigation


Transmission Electron Microscopy

FEI Tecnai G2 F20 ST FE-TEM – Materials

Morphological, crystallographic, and elemental analysis of bulk and nanoscale materials.

FEI Tecnai G2 F20 Cryo FE-TEM

  • Z-contrast dark-field STEM imaging using HAADF detector
  • Oxford instruments EDS detector
  • EELS (Electron Energy Loss Spectroscopy) for elemental mapping and high contrast zero energy loss imaging of thicker samples
  • Automated collection of tilt series for room temperature or cryo-electron tomography in TEM or STEM mode


Provides excellent contrast for biological as well as materials samples with double condenser projection lens and bright/dark field imaging.

JEOL JEM-2010 TEM (offline)

This high-resolution analytical TEM is used mainly for materials research and is capable of elemental mapping using the INCA Semi-STEM mode.

This TEM is now offline. For similar work, please contact Hansoo Kim,, to use the FEI Tecnai ST Materials TEM.