Events

Imaris Analysis Workshop

April 24, 2025

9:00 am - 4:00 pm

Fluorescence Microscopy Short Course – December 2024

December 16 - 19, 2024

9:00 am - 4:00 pm

Coming in December! $200 registration fee

FLUOVIEW FV4000 Confocal Microscope Demo

December 13 - 19, 2024

10:00 am - 4:00 pm, 10:00 am - 3:00 pm

Demo: Leica EM TIC 3x Ion Beam Milling System

August 27 - 28, 2024

12:00 pm - 5:00 pm, 10:00 am - 3:00 pm

June Fluorescence Microscopy Short Course

June 10 - 13, 2024

This short course covers the principles of optical microscopy with emphasis on fluorescence microscopy techniques.  It is intended for those who are just starting with fluorescence imaging as well as those who have experience but feel that they need better understanding of some of the techniques.  

MIC and TIPS Open House

February 1, 2024

8:30 am - 3:00 pm

Fluorescence Microscopy Short Course

December 13, 2023

9:00 am - 1:00 pm

Lectures:

• • Image formation

• • Limits of resolution

• • Principles of fluorescence

• • Microscope objectives and their performance

• • Cameras and detectors

• • Fluorescence dyes, markers and proteins

• • Deconvolution

• • Optical sectioning

• • Confocal

• • Lightsheet

• • Multiphoton microscopy

• • Superresolution microscopy

SEM Short Course

October 26, 2023

1:00 pm - 4:30 pm

Students may submit ONE of their own samples in advance, on Monday October 23rd, MIC staff will perform sample preparation so that their sample is ready for the practical session.

Note: Before bringing your sample, you must contact Stanislav Vitha, stanvitha@tamu.edu, to confirm the sample is suitable for SEM.

Lectures:

• • Basic principles of SEM: Interactions of electron beam with the sample, types of signals commonly used in SEM (SE, BSE, CL, X-Ray); SEM Design, vacuum system, electron sources, effects of accelerating voltage on resolution, charging, depth, contrast.

• • Analytical SEM : EDS, EBSD – principles, applications, examples

• • SEM of non-conductive samples, environmental SEM, Variable pressure SEM

• • Cryo-SEM, FIB, 3D SEM imaging

• • SEM in surface characterization, texture/roughness analysis, sterogrammetry

• • Principles of sample preparation for SEM

Practical, hands-on session Tuesday October 31 OR Wednesday, November 1, 9am-12pm

• Mounting and sputter coating of samples
• Basic operation of Tescan Vega and FEI Quanta FE SEM
• EDS Analysis