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Instruments

FEI Tecnai G2 F20 ST FE-TEM – Materials

Pricing

Capabilities:

Morphological, crystallographic, and elemental analysis of bulk and nanoscale materials.

Specifications:

Source:

  • ZrO₂/W (100) Schottky Field Emitter (FEG) with S-Twin objective lens
  • Fully computer-controlled and automated apertures

Detector:

  • Fischione ultra-high resolution STEM HAADF detector
  • Oxford instruments EDS detector (point, line, and area profiling)

Resolution:

0.24nm point resolution

Focus Range:

0.15nm information limit

Magnification:

  • TEM mode 21.5x-1050kx
  • STEM mode 10x-330Mx

Field of View:

TEM mode 30-4600mm

Voltage:

200kV

Stage:

  • Fully computer-controlled, eucentric side-entry, high stability CompuStage
  • Single and double tilt specimen holders (ɑ = ± 40°)

Camera:

  • Gatan 2k x 2k CCD camera
  • Orius SC200 2k x 2k camera

Software:

  • Support PC set-up with Inspect 3D for tomographic reconstructions
  • Xplore3D for automated tomographic tile series acquisition in TEM or STEM mode

For imaging services, training or other questions

please contact Dr. Hansoo Kim, luminesc@tamu.edu.


Helpful Hints:

Download the Tecnai ST Training Policy

To acquire good images on the TEM, sample thickness should typically be ≲
100nm.