JEOL JEM-2010 TEM (offline)
Pricing
Capabilities:
This high-resolution analytical TEM is used mainly for materials research and is capable of elemental mapping using the INCA Semi-STEM mode.
Specifications:
Source:
- LaB₆ filament
- Convergent-beam diffraction and nanobeam diffraction
Detector:
Oxford Instruments ATW type EDS detector with INCA Energy TEM platform for chemical analysis of element with Z≥5
Resolution:
0.23 nm point resolution
Field of View:
CCD active area is 36 x 24mm
Voltage:
200kV accelerating voltage
Stage:
- Regular single-tilt and double-tilt holders
- Heating stage up to 1200℃
- Be double-tilt holder
- Optimized for EDS analysis available with a tilting limit of +/-30°
Camera:
- Gatan SC1000 ORIUS CCD camera (Model 832)
- 4008 x 2672 pixels image size