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JEOL JEM-2010 TEM

Pricing

Capabilities:

This high-resolution analytical TEM is used mainly for materials research and is capable of elemental mapping using the INCA Semi-STEM mode.

Specifications:

Source:

  • LaB₆ filament
  • Convergent-beam diffraction and nanobeam diffraction

Detector:

Oxford Instruments ATW type EDS detector with INCA Energy TEM platform for chemical analysis of element with Z≥5

Resolution:

0.23 nm point resolution

Field of View:

CCD active area is 36 x 24mm

Voltage:

200kV accelerating voltage

Stage:

  • Regular single-tilt and double-tilt holders
  • Heating stage up to 1200℃
  • Be double-tilt holder
  • Optimized for EDS analysis available with a tilting limit of +/-30°

Camera:

  • Gatan SC1000 ORIUS CCD camera (Model 832)
  • 4008 x 2672 pixels image size

FOR IMAGING SERVICES, TRAINING, AND QUESTIONS

Please contact Rick Littleton, rick-littleton@tamu.edu.